High performing Phenom desktop SEMs that are fast, intuitive to use and low maintenance with no infrastructure required
Equipment for the fabrication of fibers and particles from nano to micro scale.
High-performance nanoindentation system that provides fast, accurate, and repeatable mechanical property data with high spatial resolution.
Precision tensiometers. Smart interfacial measurement solutions for wettability and adhesion.
Quartz crystal microbalance with dissipation, QSense and QCM-D. Instrumentation to measure molecular interactions and surface properties.
Langmuir and Langmuir-Blodgett Troughs are used to fabricate and characterize thin films with controlled packing density.
Versatile 3D optical profilers with patented focus assist for effortless metrology and imaging in true color
Multi-directional mechanical testers for the nano to milli-Newton force range
Ion milling instruments for sample surface preparation and depth profiling in transmission and scanning electron microscopes
Modular CL in-SEM system with multiple imaging modes
Combining light and electron microscopy for superlative results
Compact, easy to use and portable AFMs for research and education