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Expert Sample Preparation for High Quality Image Results Webinar

Originally Aired:

Date: May 30, 2019


Scanning Electron Microscopes (SEM) and Transmission Electron Microscopes (TEM) rely heavily on the suitable sample preparation techniques. Ten more minutes spent on sample preparation leads to hundred times better images.

View our presentation on the unique features of the Technoorg Linda Ion Milling instruments, SEMPrep2UniMill and Gentle Mill and how to spend those 10 minutes to enhance the quality of your SEM/TEM images.

  • Learn how the SEMPrep2 enables users to prepare both flat and cross-sectional samples with Peltier and Liquid Nitrogen cooling to avoid heat induced artefacts.
  • Learn about the fully automated, recipe-based operation and how it offers practically intervention-free sample preparation with the widest beam energy range and unique pre-tilted slope cutting sample holders.

Our dedicated systems – SEMPrep2 for SEM samples, UniMill for TEM samples, and Gentle Mill for FIB samples provide a complete solution to all microscopy centers and EM users.

Presentation By:

Devendra Verma, Ph.D.
Application Scientist
Nanoscience Instruments

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