Best in market patented low energy ion gun for the final cleaning of FIB and TEM samples with a special sample holder to reach the ultimate quality for any demand. Gentle Mill is a dedicated model with a unique design for end-polishing of TEM and FIB samples.
- Automated operation
- The final step for a perfect result
- protective transfer capsule
- Special adaptor for Hitachi microscopes
- Online monitoring and support
The advanced software of Gentle Mill provides fully computer control with a detailed graphical interface. All milling parameters can be stored or pre-programmed in arbitrary number of steps. This fully automated feature of the Gentle Mill allows to produce high-quality samples with minimum user intervention.
Automated perforation detection helps to protect the sample against over-milling and makes the preparation safe and easy.
“The final step”
The excellent performance of the patented ion source offers an effective, but very gentle cleaning capability to improve the quality for the final step in TEM or FIB sample preparation.
This model is suggested for users, who are looking for the best result or have special needs.
Protective transfer capsule
The newest feature of Gentle Mill gives the possibility of transferring extremely sensitive samples under vacuum or inert gas environment. The transfer capsule offers an efficient protection against oxygen, vapor or other components what may destroy or contaminate the sample surface while carrying.
Special 3D adaptor for microscopes
Special adaptor is available for Gentle Mill what gives you a fast, easy and safe solution for transferring any samples to Hitachi TEMs. Don’t need to waste time and risk the sample while transferring between the preparation device and the microscope, the same 3D sample-holder can be used.