Ion milling is a powerful technique used in SEM sample preparation to create pristine, polished surfaces without the use of chemicals or mechanical force. However, achieving high-quality results can be challenging due to issues such as sample damage, beam-induced artifacts, thermal effects, contamination, complex geometries, alignment difficulties, and long processing times. These challenges can make it difficult to precisely target areas of interest or result in poor surface quality.
The new SEMPREP SMART Broad Ion Beam Mill from Technoorg Linda is designed to overcome these limitations, offering a streamlined, high-performance solution for advanced sample preparation. Equipped with the widest energy range on the market and dual ion sources, the system allows both rapid material removal and gentle final polishing. Features such as automated gun and stage alignment, AI-assisted recipe generation, and versatile sample holders with multiple angles enable accurate, efficient, and user-friendly operation. Additionally, the enhanced SEMPrep SMART software interface provides intuitive control, remote access, and full process automation, making it easier than ever to achieve damage-free surfaces ideal for high-resolution SEM or EBSD imaging. With the SEMPrep SMART, users can prepare samples faster, with greater precision, and with consistently excellent results.
Join us for a webinar on May 15th to start your journey towards enhanced image quality and more efficient Electron Microscopy workflows!
