The GentleMill system offers the ultimate solution for precision cleaning and post-processing of focused ion beam (FIB) lamellae for transmission electron microscopy (TEM) analysis. Designed for effortless surface refinement, it transforms previously milled or FIB-prepared samples into flawless, artifact-free specimens ready for the highest-resolution imaging. The patented low-energy ion source technology ensures immaculate surface quality, uncompromised structural integrity, and results that consistently push the boundaries of modern materials research.
