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Product Brochure

Phenom ParticleX TC Desktop SEM


With the growing demand for analysis of smaller particles beyond the scope of light microscopy within automotive industries, the Phenom ParticleX Desktop SEM – Technical Cleanliness enables automated Scanning Electron Microscopy with EDX Spectrometry. This is a major advantage over light microscopy as it enables chemical classification of the particles, providing great insights in your production processes and/or environments. Standard reports compliant with VDA 19 / ISO 16232 are available.

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