EM Sample Preparation
Cross-Section Polishers & Ion Mills
Ion milling is an essential part of the sample preparation process for electron microscopy analysis. This versatile method can remove surface contamination, planarize mechanically cross-sectioned samples, or thin and polish electron-transparent lamellae.
Technoorg Linda has devoted over 35 years to continuous innovation and improvement resulting in outstanding, easy-to-use, and reliable equipment. Their ion milling technology are used in a variety of fields including material science, biological science, geology, failure analysis, metallurgy, battery, aerospace, semiconductor, and electronics in both SEM and TEM preparation.
Artifact-Free Samples
Quickly prepare samples for high quality EBSD, cross-sectional analysis, or atomic-resolution imaging
Automated Operation
Produce high quality samples with minimum user intervention by leveraging an intuitive graphical interface
Unsurpassed Thinning Rates
Variable ion sources for continuous adjustment of milling energy achieves rapid and controlled thinning
Dual Cooling Options
Booth liquid nitrogen and Peltier cooling options are available to protect the heat-sensitive samples
See available options
Ion Mill Product Options
Choose from the highest-quality, easiest to use, and most reliable ion milling tools worldwide. With a focus on compatibility and versatility, each product delivers consistent and controlled milling for high-quality SEM and TEM analysis.
The SEMPrep SMART ion mill meets the highest demands. Multifunctional device for slope cutting and damage-free surface polishing offered for SEM and EBSD users.
Gentle Mill features a patented low energy ion gun for the final cleaning of FIB and TEM samples, complete with a special sample holder for microscope transfer.
UniMill is an automated ion beam thinning system for TEM sample prep with market leading thinning rates. It allows for both rapid milling and final polishing / cleaning.