Join our microscopy specialists as we delve into the smallest defect analyses using the innovative features of the Phenom desktop scanning electron microscope. Explore many Phenom features such as elemental identification with EDS, low kV imaging, and automated acquisitions. Further leverage cross-section preparation by ion milling, and crystal defect density with cathodoluminescence to achieve meticulous and complete failure analysis. Also, inquire into our sister company Nanoscience Analytical for myriad contract services in industrial research, production, and quality assurance.
ISTFA Tools of the Trade Tour
Monday, November 13, 2023 | 5:00 – 6:30 PM | Exhibit Hall – West Hall 1
Join us for a live demonstration of the Phenom XL G2 Desktop SEM at booth #422, hosted by one of our knowledgeable application scientists. Together, we’ll delve into the practical aspects of both imaging and EDS analysis, offering a comprehensive look at the tool’s intuitive software interface, functionality, and benefits.
Pre-registration is required. Click to learn how to reserve your spot!
November 14-15, 2023:
Tuesday: 9:30 am – 6:00 pm
Wednesday: 9:00 am – 4:00 pm
Phoenix Convention Center
100 N 3rd St, Phoenix, AZ 85004