The Phenom platform continues to evolve, delivering new levels of performance, usability, and versatility in desktop scanning electron microscopy. In this webinar, we will introduce the newest generation of Phenom SEM instruments along with the latest software updates designed to enhance imaging, analysis, and workflow efficiency. Attendees will gain an overview of key hardware advancements, new system capabilities, and software improvements that expand application flexibility and improve the overall user experience.
Highlights include:
Phenom XL G3 and Pure/Pro/ProX G7
- New high-efficiency BSD
- Low kV capability: down to 1.5 kV
- Longer source lifetime: 3,000 hours
UI 2.2
- Beam setting presets
- New image gallery functions
- Fibermetric updates
