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Home > Ion Milling

Technology: Ion Milling

Ion milling is the process of removing the top amorphous layer on a material to reveal the pristine sample surface for high-resolution imaging and post-processing.

  • Ion Milling
  • Scanning Electron Microscopy
  • Electrospinning
  • Optical Tensiometry
  • Quartz Crystal Microbalance
The Polishing AR ion time dependence.

Use the Right Tools to Create the Best EBSD Images

By Devendra Verma | Read Time: 3 minutes

High Resolution Electron Back Scatter Diffraction (EBSD) and Scanning Electron Microscope (SEM) Surface/Cross Section Sample Preparation In Electron Back Scatter Diffraction (EBSD) studies, surface quality … Read more

Industry: Materials Science Technology: Ion Milling
Ion Milling at different energies.

High Performance Transmission Electron Microscopy with Focused Ion Beam Milling

By Devendra Verma | Read Time: 2 minutes

Focused Ion Beam (FIB) Sample Milling for High Performance Transmission Electron Microscopy Investigation (TEM) The use of focused ion beam (FIB) systems has become the … Read more

Industry: Materials Science Technology: Ion Milling
Ion beam milling on a TEM sample using the UniMill.

Sample Preparation for Transmission Electron Microscopy

By Devendra Verma | Read Time: 4 minutes

TEM Sample Preparation with XTEMprep Preparation Kit For study of interfaces (such as semiconductor devices, thin film layers, etc.) by transmission electron microscope (TEM) it … Read more

Industry: Materials Science Technology: Ion Milling

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  • Home
  • Products
    • Scanning Electron Microscopes
      • Phenom – Desktop SEMs
      • ParticleX – Automated SEMs
      • Axia ChemiSEM – Full Size SEM
    • Cryo-EM Solutions
      • VitroJet – Cryo-EM Sample Prep
      • CERES – Ice Contamination Prevention
      • METEOR – Integrated Cryo-CLEM
    • Surface and Interfacial Analysis
      • Theta – Optical Tensiometers (Contact Angle Goniometers)
      • Sigma – Force Tensiometers
      • QSense – QCM with Dissipation Monitoring
    • Nanomaterial Production
      • Electrospinners & Electrosprayers
      • Nanoparticle Generators
      • KSV NIMA – Langmuir-Blodgett Troughs
    • Electron Microscopy Sample Prep
      • Ion Mills for SEM, TEM, or FIB
      • Sputter Coaters (Au or Pt)
    • SEM Detectors and Solutions
      • Cathodoluminescence (CL) Detectors
      • Correlative Microscopy Detectors
      • Fast-EM – Multibeam SEM
    • TEM Solutions
      • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
      • Hybrid Pixel TEM Detectors
    • Potentiostats
      • Single-Channel Potentiostats
      • Multi-channel Potentiostats & Battery Cyclers
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
      • Overview
      • Needle Vs Needle-Less
    • Electrospraying
    • Transmission Electron Microscopy
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
    • Our People
  • News
    • Blogs
    • Webinars
    • Press Releases
    • Tradeshows & Conferences
    • Events/Workshops
    • Training Courses
  • Contact
  • Support
  • Analytical Services
  • Store
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