Tech Note | Technology: Ion Milling
Characterizing internal structures using a surface analysis technique like scanning electron microscope (SEM) requires the preparation of a cross section of the sample. Cross-sectional sample prep involves generating a clean,…
App Note | Technology: Ion Milling
High Resolution Electron Back Scatter Diffraction (EBSD) and Scanning Electron Microscope (SEM) Surface/Cross Section Sample Preparation In Electron Back Scatter Diffraction (EBSD) studies, surface quality is a key issue. Diffraction…
App Note | Technology: Ion Milling
Focused Ion Beam (FIB) Sample Milling for High Performance Transmission Electron Microscopy Investigation (TEM) The use of focused ion beam (FIB) systems has become the method of choice for site-specific…
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