Ion milling is the process of removing the top amorphous layer on a material to reveal the pristine sample surface for high-resolution imaging and post-processing.
High Resolution Electron Back Scatter Diffraction (EBSD) and Scanning Electron Microscope (SEM) Surface/Cross Section Sample Preparation In Electron Back Scatter Diffraction (EBSD) studies, surface quality … Read more
Focused Ion Beam (FIB) Sample Milling for High Performance Transmission Electron Microscopy Investigation (TEM) The use of focused ion beam (FIB) systems has become the … Read more
TEM Sample Preparation with XTEMprep Preparation Kit For study of interfaces (such as semiconductor devices, thin film layers, etc.) by transmission electron microscope (TEM) it … Read more