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Home > Scanning Electron Microscopy

Scanning Electron Microscopy

Webinar – If SEM, Then Script: Python Coding for Scanning Electron Microscopes

March 28, 2023
Categories Webinars Tags Scanning Electron Microscopy

Webinar – Morphological and Compositional Analysis of Battery Materials

March 3, 2023March 1, 2023
Categories Webinars Tags Scanning Electron Microscopy

Why Use An SEM in Battery Research? 

February 22, 2023

The functional properties of a battery, not limited to just its performance, are inherently dependent upon the microstructure and surface morphology of electrodes and separators. … Read more

Categories Blogs Tags Battery Technology, Scanning Electron Microscopy

Electron Microscopy Workshop with ASU’s School of Earth and Space Exploration

February 14, 2023

You’re invited to experience scanning electron microscopy firsthand with the Phenom Desktop SEM, guided by our own experts in live demo sessions and provided with … Read more

Categories Events/Workshops Tags Scanning Electron Microscopy

How to Combat Electric Charge Buildup in Scanning Electron Microscopy 

February 14, 2023February 8, 2023

The fundamental unit of electric charge is the electron, an elementary particle that can be used in the domain of microscopy to see beyond the … Read more

Categories Blogs Tags Scanning Electron Microscopy

Webinar – Leveraging the Power of Desktop SEMs for Drug Development

February 6, 2023February 2, 2023
Categories Webinars Tags Desktop SEM, Phenom SEM, Scanning Electron Microscopy

Desktop SEM vs Floor Model SEM: A Comparison

February 9, 2023January 9, 2023

In the realms of scientific industry and research, scanning electron microscopes are among the most common imaging tools for studying the microstructures of materials. Microscopists … Read more

Categories Blogs Tags Desktop SEM, phenom, Phenom SEM, Scanning Electron Microscopy

ISTFA 2022 | Pasadena, CA

November 14, 2022October 31, 2022
Categories Tradeshows & Conferences Tags Cathodoluminescence, Failure Analysis, Scanning Electron Microscopy, Semiconductors
Graphite imaged on the Phenom desktop SEM

SEM Image Competition 2022

October 24, 2022October 21, 2022

(Concluded on July 31, 2022; results published October 21, 2022.) Nanoscience Instruments welcomes you to our electron micrography contest: a platform to encourage creativity in … Read more

Categories Events/Workshops Tags Scanning Electron Microscopy

The Battery Show Expo | Sept. 13-15, 2022 | Novi, MI

September 15, 2022

The Battery Show Expo Desktop Scanning Electron Microscopes Quartz Crystal Microbalance with Dissapation OpticalTensiometers ForceTensiometers NanomaterialFabrication Join us September 13-15, 2022: Tuesday | 9:30 a.m. … Read more

Categories Tradeshows & Conferences Tags Battery Technology, Electrospinning & Electrospraying, Quartz Crystal Microbalance, Scanning Electron Microscopy, Tensiometry
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  • Home
  • Products
    • Scanning Electron Microscopes
      • Phenom – Desktop SEMs
      • ParticleX – Automated SEMs
      • Axia ChemiSEM – Full Size SEM
    • Cryo-EM Solutions
      • VitroJet – Cryo-EM Sample Prep
      • CERES – Ice Contamination Prevention
      • METEOR – Integrated Cryo-CLEM
    • Surface and Interfacial Analysis
      • Theta – Optical Tensiometers (Contact Angle Goniometers)
      • Sigma – Force Tensiometers
      • QSense – QCM with Dissipation Monitoring
    • Nanomaterial Production
      • Electrospinners & Electrosprayers
      • Nanoparticle Generators
      • KSV NIMA – Langmuir-Blodgett Troughs
    • Electron Microscopy Sample Prep
      • Ion Mills for SEM, TEM, or FIB
      • Sputter Coaters (Au or Pt)
    • SEM Detectors and Solutions
      • Cathodoluminescence (CL) Detectors
      • Correlative Microscopy Detectors
      • Fast-EM – Multibeam SEM
    • TEM Solutions
      • In Situ TEM Holders (Gas, Liquid, Heating, or Biasing)
      • Hybrid Pixel TEM Detectors
    • Potentiostats
      • Single-Channel Potentiostats
      • Multi-channel Potentiostats & Battery Cyclers
  • Applications
  • Techniques
    • Scanning Electron Microscopy
      • Components in a SEM
    • Electrospinning
      • Overview
      • Needle Vs Needle-Less
    • Electrospraying
    • Transmission Electron Microscopy
    • Atomic Force Microscopy
      • Contact Modes for AFM
      • Dynamic Modes for AFM
      • Electrical Modes for AFM
    • Scanning Tunneling Microscopy
    • Optical Profilometry
      • Confocal Profilometry
      • Stylus Profilometry
      • White Light Interferometry
    • Ion Milling
    • Tensiometry (Contact Angle)
      • Surface and Interfacial Tension
      • Surface Free Energy
      • Advancing and Receding Contact Angles
      • Tilting Angle Measurements
      • Surface Tension, Surface Free Energy, and Wettability
      • Captive bubble measurements
      • Corrected contact angle
    • Quartz Crystal Microbalance (QCM)
      • Electrochemical Quartz Crystal Microbalance with Dissipation Monitoring (EQCM-D)
    • Nanoparticle Synthesis
    • Langmuir Films
    • Mechanical Testing
      • Microhardness Testing
      • Mechanical Properties
    • Nanoindentation
      • Nanoindentation Methods
      • Mechanical Properties
    • Cathodoluminescence
      • Panchromatic Cathodoluminescence Imaging
      • Hyperspectral Cathodoluminescence Imaging
      • Angle-Resolved Cathodoluminescence Imaging
      • Polarization-Filtered Cathodoluminescence Imaging
  • About Us
    • Company History
    • Careers
    • Our People
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    • Tradeshows & Conferences
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