ISTFA 2025
Stop by and visit Nanoscience Instruments at booth #418 for the International Symposium for Testing and Failure Analysis (ISFTA) and discover how our class-leading microscopy solutions can elevate your material analysis!
Get hands-on experience with the Phenom desktop SEM, featuring ChemiSEM technology that allows you to simultaneously visualize sample morphology and elemental distribution for rapid, actionable insights.
Until then, we invite you to explore other solutions and services that we offer for semiconductor testing and failure analysis:
- SEMPREP SMART ion mill for preparing artifact-free cross sections of even the most delicate structures.
- Nanoscience Analytical for expert contract analysis, including SEM, tensiometry, and beyond. Let our specialists show you how these solutions can enhance your failure analysis processes.
ISTFA Tools of the Trade Tour
Monday, November 17th, 2025 | 5 – 6:30 PM | Booth #418
Join our experienced applications scientist for a live presentation of the Thermo Fisher Scientific Phenom XL desktop scanning electron microscope (SEM) and the NEW Technoorg Linda SEMPrep SMART Ion Mill. You’ll learn about the Phenom SEM’s NEW ChemiSEM and ChemiPhase software for simultaneous visualization of sample morphology and elemental composition. We’ll delve into the Phenom’s automation features, and you’ll witness how of the high-brightness cerium hexaboride source facilitates quick, actionable FA results. For optimum sample preparation, you’ll also learn about the SEMPrep SMART Ion Mill which features AI-assisted milling, precise polishing, and automated beam alignment. This presentation will showcase the FA power of both SEM and ion milling technologies, providing attendees a clear and comprehensive understanding of their capabilities.
Pre-registration is required. Registration Coming Soon!
Expo Hours
Nov. 17-19, 2025
Mon: 5 – 6:30 pm (Tour)
Tue: 9:30 am – 6:30 pm
Wed: 11/19: 9:30 am-4 pm
Location
Booth #418
Pasadena Convention Center
300 E Green St
Pasadena, CA 91101
