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Microscopy & Microanalysis 2026 | Aug 3-6, 2026 | Milwaukee, WI

Microscopy & Microanalysis 2026

Nanoscience Instruments provides advanced microscopy, sample preparation, and analytical solutions that help researchers characterize materials at the micro- and nanoscale. From routine imaging and elemental analysis to automated particle characterization and STEM-in-SEM transmission imaging, our technologies support a wide range of applications in materials science, metallurgy, semiconductors, energy storage, life sciences, industrial research, among many others.

At the 2026 M&M meeting, you can visit us in Booth #418 to explore a complementary suite of microscopy and sample preparation solutions, including:

  • Phenom XL G3 Benchtop Scanning Electron Microscope (SEM) – High-throughput SEM with the largest sample stage available in a benchtop system (100 mm x 100 mm). The XL G3 is the latest version of the most popular SEM on the market, enabling rapid imaging and elemental analysis (EDS/EDX) of large samples or up to 36 standard 0.5” sample stubs. When equipped with automation software, the Phenom XL becomes a workhorse instrument for industrial QA/QC applications.
  • Phenom Pharos Desktop FEG-SEM with STEM – Combining field-emission SEM imaging power with optional integration of Scanning Transmission Electron Microscopy (STEM) capabilities, the Phenom Pharos delivers high-resolution imaging of nanomaterials, thin films, battery materials, catalysts, polymers, biological specimens, and other beam-sensitive samples. Researchers can characterize both surface and internal structures within a single instrument by toggling between SEM and STEM modes, reducing reliance on traditional TEM workflows.
  • Phenom Software Solutions – Expand analytical capabilities of Phenom SEMs with advanced software tools including: ParticleX automated particle characterization with industry-specific reporting, MAPS large-area imaging and navigation, the Phenom Programming Interface (PPI) for Python-based workflow automation, and Avizo for quantitative image analysis and feature classification
  • SEMPREP SMART Broad Ion Beam (BIB) – Automated broad ion beam milling system for the preparation of smooth surfaces and high-quality cross sections across metals, ceramics, composites, semiconductors, batteries, and other challenging materials with delicate microstructural features. The wide energy range of the SEMPREP SMART’s ion beam enables quick milling for material removal and gentle polishing to reveal pristine surfaces with minimal artifacts.
  • LUXOR Sputter Coaters – Precision sputter coating systems for SEM sample preparation, available with platinum, gold, and carbon deposition options. Designed to improve image quality and enhance analytical performance (EDS), LUXOR coaters provide uniform conductive coatings for a wide range of materials and life science specimens.
  • SenseAI– Powerful software that accelerates electron microscopy workflows through compressed sensing and advanced image reconstruction. SenseAI enables faster data collection, reduced electron dose exposure, and more efficient generation of high-quality imaging and analytical datasets across modalities such as: SEM, TEM, STEM, 2D-STEM, 4D-STEM, Cryo-EM, Cryo-ET, and more.
  • VitroJet Cryo-EM Sample Preparation System – Automated grid vitrification technology designed to improve the reproducibility and throughput of cryo-electron microscopy (Cryo-EM) sample preparation. By precisely controlling sample deposition and vitrification conditions, the VitroJet helps researchers generate high-quality Cryo-EM specimens with reduced user variability and consistent ice quality.

Throughout the conference, our team will be available to discuss microscopy workflows, sample preparation strategies, automation tools, and advanced characterization techniques for both materials science and life science applications. We will have Phenom instruments running live in the booth for demonstrations—bring your most challenging samples to test out! Stop by Booth #418 to learn how these integrated solutions can accelerate your research, improve analytical confidence, and increase laboratory productivity.

Expo Hours

Aug 3 – 6, 2026:
Monday: 12 pm – 5:30 pm
Tuesday: 10 am – 5:30 pm 
Wednesday: 10 am – 5:30 pm
Thursday: 10 am – 2 pm

Location

Booth #418
Baird Center
400 W Wisconsin Ave
Milwaukee, WI 53203

Our Solutions

Desktop CeB₆ SEM
Desktop FEG STEM/SEM
Sputter Coaters
Particle Scanners
Ion Mills
EM Subsampling & Inpainting
Automated Cryo-EM Sample Prep
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