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2026 NanoNews: SEM Edition Q2

Welcome to the Scanning Electron Microscopy (SEM) edition of the Nanoscience Instruments newsletter, nanoNews! We are excited to share the latest updates, resources, and insights from the SEM community with you.

In this Q2 2026 newsletter, discover new resources, new partnership in North America, and exciting developments across Phenom SEM technologies. If you are interested in more updates about Phenom news, we invite you to follow us on LinkedIn!

NEWS & UPDATES

Fastmicro Particle Detection Systems 

Nanoscience Instruments is pleased to announce a strategic partnership with Fastmicro, a leading provider of automated surface particle inspection solutions. Together, the companies will deliver an integrated solution that combines rapid surface particle quantification with advanced particle characterization, helping manufacturers accelerate contamination investigations and strengthen technical cleanliness programs.

Surface particle contamination remains a significant challenge across advanced manufacturing industries, where even small contaminant particles can impact process reliability and production yield. Effective contamination control requires both the ability to quickly identify and quantify particles on critical surfaces and the analytical tools needed to determine their composition and potential source.

Learn More About Scattering Particle Analyzers

ON-DEMAND WEBINARS

Accelerating Surface Particle Contamination Control by Combining Fastmicro and Phenom Technologies

Surface particle contamination remains a critical challenge across advanced manufacturing industries, where particles can negatively impact yield, product quality, and process reliability. Effective contamination control requires both rapid surface particle …

Watch On Demand
Faster, Smarter Inclusion Analysis for Modern Metallurgical Labs

From bearings that are used in the satellites to the specialty alloy metals used in orthopedic implants and other medical devices, the pressure for cleaner and higher quality steel, aluminum …

Watch On Demand

BLOGS

Evolution of the Phenom Desktop SEM 

The Phenom Scanning Electron Microscope (SEM) is turning 20 this year! In celebration of this milestone, it is worth reflecting on how the platform has evolved, from the first true …

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Phenom Pharos STEM: Bringing True STEM Capability to the Desktop

Scanning Transmission Electron Microscopy (STEM) is a scanning-based imaging technique that uses a focused electron beam to raster scan across an ultra-thin sample, typically <150 nm. Although STEM is similar …

Read More

WHITE PAPERS

APP NOTE

Role of Desktop SEM in Rare Earth Element Exploration and Processing

Rare earth elements (REEs) are essential to many of today’s most advanced technologies, including electric vehicles, renewable energy systems, consumer electronics, aerospace components, among many others. Although relatively abundant in the Earth’s crust, economically viable REE deposits are difficult to identify and extract due to their complex mineralogy and challenging processing requirements. 

In this application note, we discuss the role of desktop SEM in rare earth element exploration and processing, and how integrated imaging and elemental analysis on the Phenom SEM platform specifically support faster informed decision-making throughout the mining workflow. 

Learn More

TECH NOTE

SEM & BIB milling for QA, QC, and Failure Analysis in Semiconductor Devices

As semiconductor devices continue to scale in complexity and shrink in feature size, ensuring device integrity, performance, and reliability has become increasingly challenging. Quality Assurance (QA), Quality Control (QC), and Failure Analysis (FA) are critical functions throughout semiconductor manufacturing, from process development to high-volume production and post-market support. Scanning Electron Microscopy (SEM) has become a foundational tool supporting these activities. Its ability to deliver high-resolution, high-contrast imaging across a wide range of materials and structures makes SEM indispensable for detecting defects, monitoring process stability, and diagnosing failures at the micro- and nanoscale.

Learn More
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