In material science, cross-section polishing is a critical method to enable the detailed examination of a sample material’s microstructure. This technique is essential for understanding…
Posted: July 10, 2024 | Technology: EM Sample Prep, Scanning Electron Microscopy
Wound care solutions are essential in medicine to protect injuries from infection, manage exudate, and create an optimal healing environment. Effective solutions promote faster and…
Posted: June 26, 2024 | Technology: Electrospinning & Electrospraying
Scanning Electron Microscopy (SEM) is one of the most important tools in the arsenal of modern material science used to characterize micro and nanoscale features….
Posted: June 19, 2024 | Technology: Scanning Electron Microscopy
Microscopy is a technique that allows us to visualize matter on length scales not visible to the human eye. Two of the most common microscopy…
Posted: June 5, 2024 | Technology:
Surface characterization plays a crucial role in various industries, from pharmaceuticals to electronics and beyond. Understanding how liquids interact with solid surfaces is essential for…
Posted: May 29, 2024 | Technology: Tensiometry
A scanning electron microscope (SEM) is capable of visualizing compositional heterogeneity on the surface of a sample by employing a backscattered electron detector (BSD). A…
Posted: May 22, 2024 | Technology: Scanning Electron Microscopy
Scanning Electron Microscopy (SEM) generates high-resolution images by scanning a focused beam of electrons across the sample surface and detecting the signals produced through beam-sample…
Posted: May 8, 2024 | Technology: Scanning Electron Microscopy
Technical cleanliness is an analytical standard to determine the level of particulate contamination on machined parts. The goal of technical cleanliness is to characterize the…
Posted: May 2, 2024 | Technology: Scanning Electron Microscopy
Particles are being used in different industries including pharmaceuticals, agriculture, food science, cosmetics, and filtration for a wide variety of applications. Several techniques are commonly…
Posted: April 30, 2024 | Technology: Electrospinning & Electrospraying
Charging is one of the most common issues when imaging non-conductive samples by scanning electron microscope (SEM) as it can distort images and damage the…
Posted: April 24, 2024 | Technology: Scanning Electron Microscopy
One of the most common challenges when analyzing non-conductive samples with a scanning electron microscope (SEM) is the charging effect. Without a conductive path, the…
Posted: April 18, 2024 | Technology: Scanning Electron Microscopy
Integrating the ability to perform high-resolution imaging and compositional analysis of materials into any laboratory becomes simplified with a desktop scanning electron microscope (SEM). In…
Posted: April 10, 2024 | Technology: Scanning Electron Microscopy
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