Backscattered electron detectors (BSD) are foundational to scanning electron microscopy (SEM) techniques. Though the first BSD iterations were invented immediately following the birth of SEM, the technology continues advancing today and expands capabilities. In this upcoming webinar, we will share the newest developments in BSD on Phenom desktop SEM and how this can enhance your work.
We will discuss what backscattered electrons (BSE) are and how they constitute BSD data. We will also share how these data are used by software and automation extensions. Then, we will share how the new BSD on Phenom expands data collection capabilities in low accelerating voltage applications – including imaging delicate samples, enhancing surface sensitivity, and finer compositional imaging.
