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Nanoscience Instruments White Papers

Tech Note | Technology: Optical Tensiometry

Accounting for Surface Roughness in Contact Angle Measurements: A Practical Approach

Contact angle measurements are a fundamental tool to understand the chemistry of surfaces and their wetting properties. Typically measured with side-on optical tensiometry, contact angle measurements are carried out by…

Tech Note | Technology: Scanning Electron Microscopy

Automated SEM/EDS Monitoring of Steel Inclusions for Compliance with ASTM Standards

In modern steel manufacturing, non-metallic inclusions represent a critical quality concern due to their effects on mechanical properties and overall steel functionality. Scanning electron microscopy (SEM) and energy dispersive X-ray…

Tech Note | Technology: Ion Milling

Cross-Section Polishing for Microanalysis

Characterizing internal structures using a surface analysis technique like scanning electron microscope (SEM) requires the preparation of a cross section of the sample. Cross-sectional sample prep involves generating a clean,…

Tech Note | Technology: Optical Tensiometry

Surface Roughness in Contact Angle Measurements – A Theoretical Perspective

Contact angle measurements are a fundamental tool to understand the chemistry of surfaces and their wetting properties. Typically measured with side-on optical tensiometry, contact angle measurements are carried out by…

Tech Note | Technology: Optical Tensiometry

Detecting Residual Solvent in Polymer films with Contact Angle Measurements

Thin polymer films, membranes, and coatings are vital for functionalizing surfaces, as a protection layer, filtering chemicals, or tuning a material’s surface interactions. When fabricating thin polymeric layers, organic solvents…

Tech Note | Technology: Scanning Electron Microscopy

Large-scale SEM Imaging with Automated Image Mapping

Acquiring large-scale images using SEM can result in trade-offs between resolution and time-to-data, making the technique difficult to apply in applications where large field-of-view imaging is needed. This Tech Note…

Tech Note | Technology: Quartz Crystal Microbalance

Optimizing Chemical Mechanical Planarization (CMP) Processes with QCM-D

Chemical mechanical planarization (CMP), also called chemical-mechanical polishing, is a critical set of processes in semiconductor manufacturing. CMP utilizes chemical etching and physical grinding with abrasive materials to level or…

Tech Note | Technology: Spark Ablation

Clean and Tunable Model Catalyst Synthesis using Spark Ablation Technology

Heterogeneous catalysts are essential in today’s chemical industry and are crucial for enabling tomorrow’s green hydrogen economy. Developing the mainstream heterogeneous catalysts of tomorrow requires a fundamental understanding of catalytic…

Tech Note | Technology: Optical Tensiometry

Leveraging Contact Angle Measurements to Predict Polymer Blending

Plastics made from polymeric materials are an integral part of many consumer goods and products. Whether it is the packaging or the product itself, different polymers can provide material and…

Tech Note | Technology: Scanning Electron Microscopy

Monitoring Technical Cleanliness with Automated SEM & EDS

Technical cleanliness is the exhaustive control of contamination across manufacturing and assembly of components to protect product integrity. In precision systems, undesirable particles can be detrimental to functionality, eroding and…

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