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2025 NanoNews: SEM Edition Q1

We’re excited to share the latest edition of SEM nanoNews with you! You’ll find updates on Phenom software, new additions to our website, and everything you need to know about upcoming events, webinars, blogs, and our expanded image gallery—all centered around Scanning Electron Microscopy (SEM).

Don’t miss out- Follow us on LinkedIn to stay up to date on news, publications and more!

NEWS & UPDATES

NEW VIDEO: Overview of the MAPS Software

Explore the ease of MAPS, a powerful cross-platform imaging software compatible with Phenom Desktop SEM! Streamline imaging with automated high-resolution stitching across large sample areas. Plus, see how to generate large-area elemental maps using EDS data for deeper material insights.

VIEW VIDEO

Pharos Desktop STEM

The STEM Sample Holder adds a new dimension of imaging capabilities to the Phenom Pharos Desktop SEM, making application diversity even more accessible and expanding advanced imaging to all levels of microscopy expertise.

Learn More

CONFERENCE CORNER

UPCOMING EVENTS:

Battery Show South

Meet us in Booth #730 at the Battery Show South Meeting! 

Nanoscience Instruments provides solutions for battery development applications through state-of-the-art instrumentation and analytical services. Stop by our booth for live demonstrations of desktop SEM with automated workflows designed for structural and chemical analysis of battery materials or learn about our process development and analytical services.

Learn More About Battery show south

AISTech 2025

At Nanoscience Instruments, we empower steelmakers by equipping them with the means to achieve comprehensive inclusion analysis in one automated system: desktop scanning electron microscopy (SEM) combined with energy dispersive X-ray spectroscopy (EDS). Automated SEM-EDS forms the functional backbone of the Phenom ParticleX Steel system, elevating high resolution imaging and microanalysis to the next level for characterizing non-metallic inclusions in steel and in other alloys like aluminum. Once detected and quantified, inclusions are automatically categorized in adherence to industry-defined standards – ASTM E45, E2142, and E2283 – and finally compiled in easy access report documents.

We’ll be set up in Booth #3105 with a Phenom ParticleX Desktop SEM running inclusion analysis live! Our automated SEM-EDS instrumentation experts are looking forward to showcasing the customizability of the system with you, as well as discussing your own goals in the steel industry.

Learn More About AISTECH2025

WEBINARS

Thursday, April 10th 2025 – 1 PM Eastern

Join us on April 10th for a webinar in which we will explore how the Phenom ParticleX Automated SEM with EDS analysis improves efficiency and reliability in cleanliness verification.

Register now

Available On Demand:

Tissue Section Analysis with Benchtop STEM

Furthering our collective understanding of biological processes is a complex, demanding endeavor. This is partly a result of the convoluted relation between macroscopic and microscopic components. One of the best …

Watch On Demand
Advanced Feature Analysis with PyPhenom

This webinar dives into the transformative capabilities of feature analysis in Scanning Electron Microscopy (SEM) using Python-powered tools. Discover how PyPhenom automates data extraction, enabling high-resolution measurements that drive innovation …

Watch On Demand
MAPS 3: Automated Image and EDS Stitching for Phenom SEMs

Take your Scanning Electron Microscopy (SEM) workflows to the next level with MAPS 3, a sophisticated solution designed to automate image and elemental mapping for complex samples. Traditional SEM analysis …

Watch On Demand

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