Phenom SEM Automation

ParticleX SEM Automation

In many industries, SEM and EDS data are essential for improving product quality and reliability. However, organizations often face challenges in establishing efficient workflows for large-scale SEM data collection and unbiased analysis needed to support data-driven decisions.

High-Throughput

Analyze up to 10,000 features per hour with a combined SEM-EDS workflow, without the need for a skilled operator.

Feature-Specific Data

Size, shape, and composition of every detected feature (e.g., particle, pore, inclusion) is recorded, allowing you to revisit any location for further analysis.

Standardized Reports

Summarize data in customizable reports containing histograms, ternary diagrams, summary tables, and pass/fail metrics for actionable insights.

Download the ParticleX Product Brochure:

Software Packages

ParticleX Packages

ParticleX software elevates the capabilities of the Phenom XL Desktop SEM, transforming it into a highly efficient tool for targeted data collection and analysis. With automated SEM-EDS workflows capable of analyzing up to 10,000 particles per hour, ParticleX delivers seamless, high-throughput quality control solutions, ensuring accurate and unbiased results for even the most demanding applications.

Standardized part cleanliness reporting for data-driven insights in line with ISO 16232 and VDA 19 standards.

Ensure quality AM powder feedstock using high throughput particle characterization.

Ensure quality steel manufacturing with automated SEM-EDS characterization of microscopic non-metallic inclusions.

The fastest and most reliable automated GSR analysis solution; ASTM E1588 compliant.

Powerful in-house solution for structural and chemical analysis of battery materials. 

Talk to an Instrumentation Specialist Today!

Knowledgebase

ParticleX Knowledgebase

Webinar

Faster, Smarter Inclusion Analysis for Modern Metallurgical Labs

From bearings that are used in the satellites to the specialty alloy metals used in orthop…

Evolution of the Phenom Desktop SEM 

The Phenom Scanning Electron Microscope (SEM) is turning 20 this year! In celebration of t…

White Paper

SEM & BIB milling for QA, QC, and Failure Analysis in Semiconductor Devices

Introduction As semiconductor devices continue to scale in complexity and shrink in featur…

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