Scanning Electron Microscopes

The fastest electron microscopes for high-quality imaging and analysis.

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Phenom Pro / ProX

Product Image of the Phenom ProX SEM

The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. A unique and powerful core architecture combines with a host of hardware and software features to provide the most complete tabletop SEM solution on the market.

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Features

The Phenom Pro/ProX tabletop SEM a high-performance SEM for imaging and analysis. Upgrade the Pro to a ProX for analyzing, sample structures and their elemental composition. The optional Elemental Mapping and Line Scan software allows further analysis of the distribution of elements. The innovative design of the Phenoms provides a list of advantages over every other desktop SEM:

  • Only 30 seconds sample loading to electron imaging. The Phenom desktop SEM is the fastest SEM.
  • The high brightness Cerium Hexaboride (CeB6) source is 10x brighter than tungsten sources resulting in better image resolution at lower accelerating voltages on any sample.
  • Multiple acceleration voltages/li>
  • Color optical camera for single-click navigation
  • Charge reduction mode reduces need to coat samples
  • Elemental analysis with EDS option
  • Secondary electron detector option
  • Small footprint
  • No infrastructure needed

Sample Holder for Phenom Scanning Electron Microscopes

Pro/Pure Accessories

Phenom sample holders are designed for optimizing sample loading speed and guarantee the fastest time to image available in the market.

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Phenom Pro Suite Interface for Phenom Scanning Electron Microscopes

Phenom Software

Software options are available to meet your SEM needs, including automated and market-specific solutions. Energy dispersive X-ray spectroscopy (EDS) can be added to analyze the elemental composition of samples.

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Specifications

Category Pro / ProX Specification
Electron source Ultra high brightness, long life CeB6 crystal source
Optical navigation camera 20 – 135x magnification; color image; bright-field and dark-field illumination
SEM magnification range 80 – 150,000x
Resolution < 10 nm (BSD) & < 8 nm (SED)
Digital zoom Max. 12x
Acceleration voltages 5 – 15 kV
Vacuum modes High and low vacuum
Detectors BSD
EDS (optional)
SED (optional)
Sample diameter Max. 32 mm
Sample height Max. 100 mm
More info Compare with the Phenom XL and Pure