ISTFA 2026  | Oct 6 – 7, 2026 | San Antonio, TX

ISTFA 2026 Stop by and visit Nanoscience Instruments at booth #425 for the International Symposium for Testing and Failure Analysis (ISFTA) and discover how our class-leading microscopy solutions can elevate your material analysis! Get hands-on experience with the Phenom Desktop SEM, featuring ChemiSEM technology that allows you to simultaneously visualize sample morphology and elemental distribution […]

American Chemical Society (ACS) Fall 2026 | Aug 24 – 26, 2026 | Chicago, IL

ACS Fall 2026 Nanoscience Instruments provides advanced solutions for nanomaterial fabrication and characterization, helping researchers across polymer science, biomaterials, and surface chemistry advance their work. From electrospinning nanofibers to characterizing surface and interfacial properties, our technologies support a wide range of applications in materials science, biomedical research, and industrial R&D. At this year’s meeting, you […]

Nanoscience Instruments and Fastmicro Announce Partnership in North America

Combined technologies enable faster and more effective surface particle contamination analysis Phoenix, AZ — Nanoscience Instruments is pleased to announce a strategic partnership with Fastmicro, a leading provider of automated surface particle inspection solutions. Together, the companies will deliver an integrated solution that combines rapid surface particle quantification with advanced particle characterization, helping manufacturers accelerate […]

Nanoscience Instruments Expands Polymer Processing Solutions through Strategic Partnership with Fontijne Presses

New Partnership Brings Advanced Laboratory Platen Press Solutions to North American Researchers Nanoscience Instruments is pleased to announce a new strategic partnership with Fontijne Presses, a globally recognized manufacturer of precision laboratory platen presses. Through this agreement, Nanoscience Instruments will serve as the exclusive distributor of Fontijne Presses systems in North America, expanding its portfolio […]

Phenom Pharos STEM: Bringing True STEM Capability to the Desktop

Scanning Transmission Electron Microscopy (STEM) is a scanning-based imaging technique that uses a focused electron beam to raster scan across an ultra-thin sample, typically <150 nm. Although STEM is similar to Scanning Electron Microscopy (SEM), it differs fundamentally in how electrons interact with the sample and how signals are generated (comparison shown in Table 1). […]

2-Day SEM Short Course | Phoenix, AZ | Nov. 4 – 5, 2026

2-Day SEM Short Course: Explore the microscopic world in our specialized 2-day Scanning Electron Microscopy (SEM) Short Course. Held in Phoenix, AZ, this immersive program is designed for both experienced practitioners and newcomers, offering an in-depth exploration of both fundamental and advanced SEM techniques. Hosted at our state-of-the-art facilities, the course features hands-on sessions with […]

2-Day SEM Short Course | Alexandria, VA | Sept. 2 – 3, 2026

2-Day SEM Short Courses: Explore the microscopic world in our specialized 2-day Scanning Electron Microscopy (SEM) Short Course. Held in Alexandria, VA, this immersive program is designed for both experienced practitioners and newcomers, offering an in-depth exploration of both fundamental and advanced SEM techniques. Hosted at our state-of-the-art facilities, the course features hands-on sessions with […]

How Wettability Analysis Improves Semiconductor Package Performance and Reliability

As semiconductor devices continue to shrink and packaging architectures grow more complex, surface interactions play an increasingly important role in overall performance and reliability. Wettability analysis has become a key quality and process-control tool across the semiconductor packaging workflow. From solder joint formation to underfill flow and photoresist coating behavior, understanding how liquids interact with […]

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.